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ANHUI CRYSTRO CRYSTAL MATERIALS Co., Ltd.
ANHUI CRYSTRO CRYSTAL MATERIALS CO., LTD. INNOVATOR FOR MAGNETO OPTICAL CRYSTALS
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Fe Doped LiTaO3 Crystals Lithium Tantanlate Wafer For E-O Devices

ANHUI CRYSTRO CRYSTAL MATERIALS Co., Ltd.
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Fe Doped LiTaO3 Crystals Lithium Tantanlate Wafer For E-O Devices

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Brand Name : Crystro

Model Number : CR210816-01

Certification : SGS/COC

Place of Origin : China

MOQ : 1pc

Price : USD 20-200/pc

Payment Terms : T/T, Western Union, MoneyGram, Paypal

Supply Ability : 2000pcs per month

Delivery Time : 3-5 weeks

Packaging Details : Transparent clean box

Material : Fe doped LiTaO3 Crystals Lithium Tantanlate Wafer Used For E-O devices

Mohs Hardness : 5.5

Diameter : Φ4''-6''

Tol(±) : <0.20 mm

Thickness : 0.18 ~ 0.5mm or more

Primary Flat : 22mm /32mm /42.5mm /57.5mm

LTV (5mmx5mm) : <1µm

TTV : <3µm

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Fe doped LiTaO3 Crystals Lithium Tantanlate Wafer Used For E-O devices

LiTaO3 is an E-O crystal widesly used for E-O devices, due to its good optical NLO and E-O properties, as well as high damage threshold. Crystro supplies hign quality LiTaO3 boules and wafers with the following specifications for standard applications. We can also offer other specification upon request:

Crystro's Fe:LiTaO3 is grown by Czochralski method.Max diameter reach 6inch,Crystro can offer kinds of size per required.

Anhui Crystro participate in the kinds exhibitions every year: Laser World of Photonics Munich, Shanghai, Photonics West in San Francisco, CIOE in Shenzhen, etc.We looking forward to meet you.

Typical Specifications:

Material LiTaO3 wafers(White or Black &Fe doped)
Curie Temp 603±2℃
Cutting Angle X/Y/Z/X112Y/Y36/Y42/Y48/etc
Diameter/size 2”/3”/4" LT wafer or other size
Tol(±) <0.20 mm
Thickness 0.18 ~ 0.5mm or more
Primary Flat 22mm /32mm /42.5mm /57.5mm
LTV (5mmx5mm) <1µm
TTV <3µm
Bow -30<bow<30
Warp <40µm
PLTV(<0.5um) ≥95%(5mm*5mm)
Orientation Flat All available
Surface Type Single Side Polished /Double Sides Polished
Polished side Ra <0.5nm
Back Side Criteria General is 0.2-0.5µm or as customized
Edge Criteria R=0.2mm or Bullnose
Fe doped Fe doped for saw grade LN< wafers
Wafer Surface Criteria Transmissivity general:5.9x10-11<s<2.0*10-10 at 25℃
Contamination, None
Particles ¢>0.3 µ m <= 30
Scratch , Chipping None
Defect No edge cracks, scratches, saw marks, stains

Fe Doped LiTaO3 Crystals Lithium Tantanlate Wafer For E-O Devices


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